mirror of
https://github.com/memtest86plus/memtest86plus.git
synced 2025-02-25 18:55:23 -06:00
Update README to include the new error reporting modes.
This commit is contained in:
parent
461fdd2e8a
commit
63e0ee1a3b
56
README.md
56
README.md
@ -274,6 +274,8 @@ The configuration menu allows the user to:
|
||||
* error summary
|
||||
* individual errors
|
||||
* BadRAM patterns
|
||||
* Linux memmap
|
||||
* bad pages
|
||||
* select which of the available CPU cores are used (at startup only)
|
||||
* a maximum of 256 CPU cores can be selected, due to memory and
|
||||
display limits
|
||||
@ -291,7 +293,9 @@ The error reporting mode may be changed at any time without disrupting the
|
||||
current test sequence. Error statistics are collected regardless of the
|
||||
current error reporting mode (so switching to error summary mode will show
|
||||
the accumulated statistics since the current test sequence started). BadRAM
|
||||
patterns are only accumulated when in BadRAM mode.
|
||||
patterns are only accumulated when in BadRAM mode. Linux memmap regions are
|
||||
only accumulated when in memmap mode. Bad page numbers are only accumulated
|
||||
when in bad page mode.
|
||||
|
||||
Any change to the selected tests, address range, or CPU sequencing mode will
|
||||
start a new test sequence and reset the error statistics.
|
||||
@ -343,17 +347,18 @@ instance:
|
||||
### BadRAM Patterns
|
||||
|
||||
The BadRAM patterns mode accumulates and displays error patterns for use with
|
||||
the [Linux BadRAM feature](http://rick.vanrein.org/linux/badram/). Lines are
|
||||
printed in the form `badram=F1,M1,F2,M2...` In each `F,M` pair, the `F`
|
||||
represents a fault address and the `M` is a bitmask for that address. These
|
||||
the [Linux BadRAM feature](http://rick.vanrein.org/linux/badram/) or [GRUB
|
||||
badram command](https://www.gnu.org/software/grub/manual/grub/grub.html#badram).
|
||||
Lines are printed in the form `badram=F1,M1,F2,M2...` In each `F,M` pair, the
|
||||
`F` represents a fault address and the `M` is a bitmask for that address. These
|
||||
patterns state that faults have occurred in addresses that equal F on all `1`
|
||||
bits in M. Such a pattern may capture more errors that actually exist, but
|
||||
bits in M. Such a pattern may capture more errors than actually exist, but
|
||||
at least all the errors are captured. These patterns have been designed to
|
||||
capture regular patterns of errors caused by the hardware structure in a terse
|
||||
syntax.
|
||||
|
||||
The BadRAM patterns are grown incrementally rather than calculated from an
|
||||
overview of all errors. The number of pairs is constrained to ten for a
|
||||
overview of all errors. The number of pairs is constrained to 20 for a
|
||||
number of practical reasons. As a result, handcrafting patterns from the
|
||||
output in address printing mode may, in exceptional cases, yield better
|
||||
results.
|
||||
@ -363,6 +368,39 @@ address test (test 0) and the block move test (test 7) do not contribute to
|
||||
the BadRAM patterns as these tests do not allow the exact address of the
|
||||
fault to be determined.
|
||||
|
||||
### Linux memmap
|
||||
|
||||
The Linux memmap mode accumulates and displays faulty memory regions for use
|
||||
with the [Linux memmap boot command line option]
|
||||
(https://www.kernel.org/doc/Documentation/admin-guide/kernel-parameters.txt).
|
||||
Lines are printed in the form `memmap=S1$A1,S2,A2...` In each `S,A` pair, the
|
||||
`A` represents the first address in the region and the `S` is the size of the
|
||||
region (in bytes). Up to 20 faulty memory regions are recorded. Once more than
|
||||
20 regions of contiguous faulty locations have been found, regions will be
|
||||
merged, which will mean some regions include non-faulty locations. The program
|
||||
will try to minimise the number of non-faulty locations that are included.
|
||||
|
||||
**NOTE** As mentioned in the individual test descriptions, the walking-ones
|
||||
address test (test 0) and the block move test (test 7) do not contribute to
|
||||
the faulty memory regions as these tests do not allow the exact address of
|
||||
the fault to be determined.
|
||||
|
||||
### Bad Pages
|
||||
|
||||
The bad pages mode accumulates and displays faulty memory page numbers. These
|
||||
may be used with the Windows bcdedit command to add those pages to the Windows
|
||||
PFA memory list. The page numbers are either displayed as a single hexadecimal
|
||||
number (e.g. `0x20`) or a range of hexadecimal page numbers (e.g. `0x20..0x2a`).
|
||||
Up to 20 ranges of faulty pages are recorded. Once more than 20 ranges of
|
||||
contiguous faulty pages have been found, ranges will be merged, which will
|
||||
mean some ranges include non-faulty pages. The program will try to minimise
|
||||
the number of non-faulty pages that are included.
|
||||
|
||||
**NOTE** As mentioned in the individual test descriptions, the walking-ones
|
||||
address test (test 0) and the block move test (test 7) do not contribute to
|
||||
the faulty page numbers as these tests do not allow the exact address of the
|
||||
fault to be determined.
|
||||
|
||||
## Trouble-shooting Memory Errors
|
||||
|
||||
Please be aware that not all errors reported by Memtest86+ are due to bad
|
||||
@ -517,8 +555,8 @@ memory region in turn. Caching is enabled for all but the first test.
|
||||
### Test 0 : Address test, walking ones, no cache
|
||||
|
||||
In each memory region in turn, tests all address bits by using a walking
|
||||
ones address pattern. Errors from this test are not used to calculate BadRAM
|
||||
patterns.
|
||||
ones address pattern. Errors from this test do not contribute to BadRAM
|
||||
patterns, memmap regions, or bad page regions.
|
||||
|
||||
### Test 1 : Address test, own address in window
|
||||
|
||||
@ -571,7 +609,7 @@ the movs instruction. After the moves are completed the data patterns are
|
||||
checked. Because the data is checked only after the memory moves are completed
|
||||
it is not possible to know where the error occurred. The addresses reported
|
||||
are only for where the bad pattern was found. In consequence, errors from this
|
||||
test are not used to calculate BadRAM patterns.
|
||||
test do not contribute to BadRAM patterns, memmap regions, or bad page regions.
|
||||
|
||||
### Test 8 : Random number sequence
|
||||
|
||||
|
Loading…
Reference in New Issue
Block a user