memtest86plus/tests
Lionel Debroux 2f6ab949ae Significantly optimize the bit fade and own addr tests for size, by folding near-identical switch case bodies together, and removing code duplication by merging pattern_fill() and pattern_check(). Also, add a rep stos[lq] path in the bit fade test.
Before:
   text    data     bss     dec     hex filename
   1581       4       0    1585     631 tests/bit_fade.o
   1236       0       0    1236     4d4 tests/own_addr.o

After:
   text    data     bss     dec     hex filename
   1013       4       0    1017     3f9 tests/bit_fade.o
    787       0       0     787     313 tests/own_addr.o
2025-02-10 22:05:21 +01:00
..
addr_walk1.c Add initial NUMA awareness support (#378) 2024-03-13 01:43:26 +01:00
bit_fade.c Significantly optimize the bit fade and own addr tests for size, by folding near-identical switch case bodies together, and removing code duplication by merging pattern_fill() and pattern_check(). Also, add a rep stos[lq] path in the bit fade test. 2025-02-10 22:05:21 +01:00
block_move.c Add LoongArch support (#410) 2024-08-30 13:38:46 +02:00
modulo_n.c Add initial NUMA awareness support (#378) 2024-03-13 01:43:26 +01:00
mov_inv_fixed.c Add LoongArch support (#410) 2024-08-30 13:38:46 +02:00
mov_inv_random.c Add initial NUMA awareness support (#378) 2024-03-13 01:43:26 +01:00
mov_inv_walk1.c Add initial NUMA awareness support (#378) 2024-03-13 01:43:26 +01:00
own_addr.c Significantly optimize the bit fade and own addr tests for size, by folding near-identical switch case bodies together, and removing code duplication by merging pattern_fill() and pattern_check(). Also, add a rep stos[lq] path in the bit fade test. 2025-02-10 22:05:21 +01:00
test_funcs.h Significantly optimize the bit fade and own addr tests for size, by folding near-identical switch case bodies together, and removing code duplication by merging pattern_fill() and pattern_check(). Also, add a rep stos[lq] path in the bit fade test. 2025-02-10 22:05:21 +01:00
test_helper.c Add initial NUMA awareness support (#378) 2024-03-13 01:43:26 +01:00
test_helper.h Add the 64-bit and 32-bit CC flag 2024-07-22 22:50:15 +02:00
tests.c Significantly optimize the bit fade and own addr tests for size, by folding near-identical switch case bodies together, and removing code duplication by merging pattern_fill() and pattern_check(). Also, add a rep stos[lq] path in the bit fade test. 2025-02-10 22:05:21 +01:00
tests.h Reduce padding and relocations (#355) 2023-11-29 12:45:17 +01:00