memtest86plus/tests/test_funcs.h
Lionel Debroux 2f6ab949ae Significantly optimize the bit fade and own addr tests for size, by folding near-identical switch case bodies together, and removing code duplication by merging pattern_fill() and pattern_check(). Also, add a rep stos[lq] path in the bit fade test.
Before:
   text    data     bss     dec     hex filename
   1581       4       0    1585     631 tests/bit_fade.o
   1236       0       0    1236     4d4 tests/own_addr.o

After:
   text    data     bss     dec     hex filename
   1013       4       0    1017     3f9 tests/bit_fade.o
    787       0       0     787     313 tests/own_addr.o
2025-02-10 22:05:21 +01:00

37 lines
856 B
C

// SPDX-License-Identifier: GPL-2.0
#ifndef TEST_FUNCS_H
#define TEST_FUNCS_H
/**
* \file
*
* Provides the prototypes for the basic test functions used to implement
* the tests.
*
*//*
* Copyright (C) 2020-2022 Martin Whitaker.
*/
#include <stdbool.h>
#include "test.h"
int test_addr_walk1(int my_cpu);
int test_own_addr1(int my_cpu, int stage);
int test_own_addr2(int my_cpu, int stage);
int test_mov_inv_fixed(int my_cpu, int iterations, testword_t pattern1, testword_t pattern2);
int test_mov_inv_walk1(int my_cpu, int iterations, int offset, bool inverse);
int test_mov_inv_random(int my_cpu);
int test_modulo_n(int my_cpu, int iterations, testword_t pattern1, testword_t pattern2, int n, int offset);
int test_block_move(int my_cpu, int iterations);
int test_bit_fade(int my_cpu, int stage, int sleep_secs);
#endif // TEST_FUNCS_H